Clipped on the Earth , prodded the N and the second the L was prodded. before the Button was operated, the Rcbo tripped. I tried the tester on 3 other Rcbos in the same board and the same happened. Baffles me why it does it, I wondered if it could be a voltage N to E causing it, so next time if it happens i may measure it. At least 1 other engineer with similar tester has experienced it.
I'm not doubting what you told us but am surprised (and a little concerned) and, like you, have to wonder about the explanation.
I had always assumed that the leads of a tester were (on 'ranges' like RCD testing, loop testing, IR etc.) essentially 'isolated' from anything unless/until one pressed the tester's 'test' button. However, from what you say this is not the case and that, even without the 'test button' pressed, there is a relatively low impedance between the L and E leads (or maybe an even lower one between L and N). This presumably means that one has to be careful (and should be warned to be careful) what one does with the test leads (i.e. allows them to touch) even before one presses the test button.
From what you say, I'm not sure whether this is a transient or permanent problem. If the latter, then it would presumably be impossible to do any RCD testing, since the RCD would trip every time one connected the leads. However, if it's 'transient' (only happens when one first connects the leads, but with the RCD 're-settable'), that's would be even more difficult to understand/explain!
Maybe its wrong but like Securespark, due to the type of boards we work on, for safety reasons i often test at the socket first and if that fails, then do the Rcbo in isolation ....
As I've said/implied, for what it's worth that is what I would do, BUT ....
.... and if that passes then fine .... if it finally passes in isolation, im happy with that ...
As I've said, my personally view is that this is crucially dependent upon the the nature of the 'fail' when tested at a socket. As I've said, if it 'fails' only because it trips with a test current less than 0.5 x I
Δn (tripping time being OK), but 'passes' when the device is tested 'in isolation', then the 'on-load fail' is almost always going to be due to L-E 'leaks' due to connected loads - so, as you say, in most senses that is 'fine'. Having said that, the owner of the installation should presumably be 'warned' (maybe with some recommendations about loads, and distribution thereof), particularly if (when tested at a socket) it trips at well below 0.5 x I
Δn - since there will then be a high risk of 'nuisance trips'.
However,
IF the 'fail' when tested at a socket is because the RCD does not trip at I
Δn, and/or if the trip time is too long, then I personally feel that it would be wrong, inappropriate and potentially dangerous to 'pass' it (say is was 'fine')
even if it 'tested OK' in isolation. Do you disagree with that? Would you really be happy leaving an installation (and describing it as a 'pass') if the evidence you had (from your test) suggested that, in normal service, the RCD might well not trip if a leakage current (maybe through a person!) >30 mA were to arise?
In passing, I'm a bit confused by ...
... it passed the first tests but failed the 5 times test twice when tested at the socket, which as we do commercial stuff, was aprox 50 metres from the board. .... due to this like securespark i opted to go test at the Rcbo, as usual like most pubs, the Db was a mess and jammed pack, it was unsafe to disconnect the load due to the wires buried deep at the rear.
Isn't it extremely unlikely that 'testing at the RCBO' will produce any different results from 'testing at the socket', if all the same loads remain connected to the circuit? Am I missing something?
Kind Regards, John