Looking back, do you remember if any of them were designed to handle DC or pulsing currents? MEMshield, have been for many years, and are quite common.
"That" topic again
However, on the assumption that "that issue" does sometimes show itself in practice, does it not underline and support what I am saying? - i.e. that if an RCD 'fails' (because of too high a trip threshold or too long a trip time) when tested 'in situ', but 'passes' when tested 'in isolation', one should
NOT regard that as a 'pass' - since the implication is that
something (be it current waveforms in connected loads or whatever) which is at play when the RCD is in service is, or may be, impairing the ability of the device to operate satisfactory/safely in its in-service environment?
As far as pass/fail of the testing is concerned, the reason for failing in-situ ('on load') testing is surely irrelevant - if (for any reason) it cannot function satisfactory when 'in situ', that means that it is not safe, and therefore should not 'pass', even if it "works fine on the bench"?
It has been suggested that the 'in-situ' test failures may not be a true representation of the actual performance but, rather, an erroneous test result (maybe as a consequence of connected wiring or loads). That's obviously not impossible, but it is surely not safe to simply
guess that such is happening. If the 'best (but not perfect) means of testing' reports a 'fail', then we surely have to assume that it may be (probably is) doing so correctly?
Kind Regards, John